Hairong Lei, Qian Dong, C. Teh, Lingling Pu, C. Jen, Steve Lin
{"title":"改进电子束缺陷分类的妨害率","authors":"Hairong Lei, Qian Dong, C. Teh, Lingling Pu, C. Jen, Steve Lin","doi":"10.1109/asmc54647.2022.9792486","DOIUrl":null,"url":null,"abstract":"The proposed paper presents a case study describing how e-beam defect classification nuisance rate (NR) can be improved by the implementation of a new machine learning classification process in HMI e-Manager even for difficult data (feature boundary is overlay). This is important because low nuisance rate is an importance metric to measure the e-beam defect classification performance and it is usually difficult to obtain the low nuisance rate, especially for difficult defect dataset. Our machine learning (not a deep learning) multiple-phase classification results show that it is an effective way to improve the E-beam defect classification nuisance rate.","PeriodicalId":436890,"journal":{"name":"2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)","volume":"320 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Nuisance Rate Improvement of E-beam Defect Classification\",\"authors\":\"Hairong Lei, Qian Dong, C. Teh, Lingling Pu, C. Jen, Steve Lin\",\"doi\":\"10.1109/asmc54647.2022.9792486\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The proposed paper presents a case study describing how e-beam defect classification nuisance rate (NR) can be improved by the implementation of a new machine learning classification process in HMI e-Manager even for difficult data (feature boundary is overlay). This is important because low nuisance rate is an importance metric to measure the e-beam defect classification performance and it is usually difficult to obtain the low nuisance rate, especially for difficult defect dataset. Our machine learning (not a deep learning) multiple-phase classification results show that it is an effective way to improve the E-beam defect classification nuisance rate.\",\"PeriodicalId\":436890,\"journal\":{\"name\":\"2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)\",\"volume\":\"320 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-05-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/asmc54647.2022.9792486\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/asmc54647.2022.9792486","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Nuisance Rate Improvement of E-beam Defect Classification
The proposed paper presents a case study describing how e-beam defect classification nuisance rate (NR) can be improved by the implementation of a new machine learning classification process in HMI e-Manager even for difficult data (feature boundary is overlay). This is important because low nuisance rate is an importance metric to measure the e-beam defect classification performance and it is usually difficult to obtain the low nuisance rate, especially for difficult defect dataset. Our machine learning (not a deep learning) multiple-phase classification results show that it is an effective way to improve the E-beam defect classification nuisance rate.