下填土混合模态拉伸试验

H. Yamaguchi, T. Enomoto
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引用次数: 0

摘要

在倒装芯片封装(FCPKG)中,下填充(UF)用于加强焊料凸起并提高封装的可靠性。UF裂缝周围的加载模式分为拉伸(I型)和剪切(II型)两种模式,这两种模式的发生取决于外部荷载和构件结构。对于实际组件,这两种模式通常是混合的。为了提高分析和材料设计的精度,有必要对每种模式I/ II混合率下的断裂韧性进行评估。断裂韧性和断裂模式受载荷模式混合率、树脂层厚度和树脂成分的影响。我们调查了这些因素之间的关系。对不同填料含量、不同配比的超滤材料进行了混模拉伸试验。测量是从几个不同的角度进行的。测量了最大载荷值并观察了断裂模式。大部分试样均表现出界面分层现象,但较低的角度(较高的I型率)会导致整体黏结断裂,从而导致较低的载荷韧性。高树脂含量增加最大载荷值,弹性体添加剂增强界面附着力。此外,树脂层厚度与断裂方式有关。通过研究,得到了弹性体添加剂的加载模式与断裂模式的关系,以及弹性体添加剂的增韧效果。
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Mixed Mode Tension Test of Underfills
In flip-chip packages (FCPKG), underfill (UF) is applied to reinforce solder bumps and enhance reliability of the package. Loading mode around cracks in UF is divided into tension (Mode I) and shear (Mode II). These two modes occur depending on the external load and the component structures. As for real components, these two modes are usually mixed. For higher precision of analyses and material design, it is essential to evaluate fracture toughness for each mixture rate of Mode I/ Mode II.Fracture toughness and fracture mode are influenced by mode mixture rate of the load, resin layer thickness as well as resin ingredients. We investigated the relationship between these factors. Mixed mode tension tests have been conducted for UF samples with different filler content and compound. Measurements were conducted at several different angles. Maximum load values were measured and fracture modes were observed.Most of specimens showed interfacial delamination, but lower angle (higher rate of mode I) induces bulk cohesive fracture and gives lower load toughness. High resin content increases max load value, and elastomer additive reinforces interfacial adhesion. Besides, resin layer thickness has relation with the fracture mode.Through this study, we obtained relationship between loading mode and fracture mode, and toughness enhancement effect of elastomer additive.
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