量子阱中的最佳电吸收:激子约束与线宽展宽之间的折衷

K. W. Jelley, R. Engelmann, K. Alavi, H. Lee
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摘要

GaAs/AlxGa1-xAs多量子阱(MQW)结构中电吸收与阱宽度(Lz)的关系对优化光调制器件具有重要意义。然而,包括窄井宽限制在内的完整表征仍然缺乏。在此之前,我们已经报道了对于具有100个Å势垒的GaAs/Al0.32Ga0.68As MQWs,吸收系数(Δαmax)的最大可得变化随着Lz(从260到50 Å)的减小而单调增加,其代价是外加电场(εmax)的增加据预测,峰值将在Lz = 25 Å附近达到,在较低的Lz处受到介电击穿或井中载流子约束减少的限制。为了确定GaAs/AlxGa1-xAs MQW结构中带边电吸收的完全阱宽依赖性,我们的实验扩展到47到17 Å范围。我们证明,这个范围确实包含一个Lz的最优值,它在Δαmax中提供峰值。但与我们的预测相反,我们将证明,由小Lz声子散射引起的重空穴激子共振的增强展宽是导致这一结果的原因。
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Optimum Electroabsorption in Quantum Wells as a Compromise between Exciton Confinement and Linewidth Broadening
The dependence of electroabsorption in GaAs/AlxGa1-xAs multiple quantum well (MQW) structures on well width (Lz) is of considerable importance in optimizing optical modulation devices.1,2 However, a complete characterization including the narrow well width limit has still been lacking. Previously, we have reported that for GaAs/Al0.32Ga0.68As MQWs with 100 Å barriers the maximum obtainable change in the absorption coefficient (Δαmax) increases monotonically with decreasing Lz (from 260 to 50 Å) at the cost of an increasing applied electric field (εmax).2 It was predicted that a peak value would be reached near Lz = 25 Å, being limited at lower Lz by either dielectric breakdown or reduced carrier confinement in the well. In order to determine the complete well width dependence of band edge electroabsorption in GaAs/AlxGa1-xAs MQW structures, our experiments were extended to cover the range from 47 to 17 Å. We demonstrate that this range does indeed contain an optimum value of Lz that provides a peak value in Δαmax. But contrary to our prediction, we shall show that enhanced broadening of the heavy hole excitonic resonance, resulting from phonon scattering at small Lz, is responsible for this result.
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