{"title":"一种克服功率MOSFET TDR测量中信号不稳定性的创新方法","authors":"S. Y. Tan, K. K. Ng, S. Y. Gan, C. Sin","doi":"10.1109/IPFA.2014.6898150","DOIUrl":null,"url":null,"abstract":"Hand probing is the most common technique being applied in Time Domain Reflectometry (TDR) measurement. It is a simple and easy method, but it produced instability on overall signal. Therefore, a new test fixture is designed to maximize its reproducibility. Repeatability test will be used to show its effectiveness on Power MOSFET. In addition, with the test fixture, the standard deviation for impedance results was σ=0.12 based on the same part for eight times measurement, compare to σ=3.26 with hand probing. Therefore a significant improvement on the repeatability test was clearly demonstrated.","PeriodicalId":409316,"journal":{"name":"Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","volume":"197 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An innovative method to overcome signal instability during TDR measurement of power MOSFET\",\"authors\":\"S. Y. Tan, K. K. Ng, S. Y. Gan, C. Sin\",\"doi\":\"10.1109/IPFA.2014.6898150\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Hand probing is the most common technique being applied in Time Domain Reflectometry (TDR) measurement. It is a simple and easy method, but it produced instability on overall signal. Therefore, a new test fixture is designed to maximize its reproducibility. Repeatability test will be used to show its effectiveness on Power MOSFET. In addition, with the test fixture, the standard deviation for impedance results was σ=0.12 based on the same part for eight times measurement, compare to σ=3.26 with hand probing. Therefore a significant improvement on the repeatability test was clearly demonstrated.\",\"PeriodicalId\":409316,\"journal\":{\"name\":\"Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"volume\":\"197 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-09-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPFA.2014.6898150\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2014.6898150","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An innovative method to overcome signal instability during TDR measurement of power MOSFET
Hand probing is the most common technique being applied in Time Domain Reflectometry (TDR) measurement. It is a simple and easy method, but it produced instability on overall signal. Therefore, a new test fixture is designed to maximize its reproducibility. Repeatability test will be used to show its effectiveness on Power MOSFET. In addition, with the test fixture, the standard deviation for impedance results was σ=0.12 based on the same part for eight times measurement, compare to σ=3.26 with hand probing. Therefore a significant improvement on the repeatability test was clearly demonstrated.
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