常温下电铸铜基板光滑金表面的键合

T. Matsumae, Michitaka Yamamoto, Y. Kurashima, E. Higurashi, H. Takagi
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引用次数: 0

摘要

采用电铸法制备了具有光滑金键合膜的铜基导热片,用于与电子器件在大气环境下的室温键合。采用Au/Cu(自下而上)和Au/Ta/Cu种子层沉积在光滑的热氧化硅片上,电铸Cu衬底;然后在Au/SiO2界面处进行剥离。采用表面活化键合的方法,将剥离后的金表面与金属化金硅片表面在常温下进行了键合。在Au/Cu层电铸的Cu衬底上,Cu原子通过Au膜扩散,在表面形成CuO,导致结合力差。然而,在Au/Ta/Cu种子层中,由于Cu的扩散被Ta势垒层阻挡,Cu衬底被强键合。预计该技术将有助于在室温下实现半导体器件与散热器之间的直接键合,而无需使用真空键合设备。
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Room temperature bonding of smooth Au surface of electroformed Cu substrate in atmospheric air
A Cu-based heat spreader with smooth Au bonding film was fabricated by electroforming for room temperature bonding with electronic device in atmospheric air. The Cu substrates were electroformed using Au/Cu (bottom to top) and Au/Ta/Cu seed layers deposited onto smooth thermally-oxidized Si wafers; next, they were exfoliated at the Au/SiO2 interface. The exfoliated Au surface was bonded with the surface of Au-metallized Si chip at room temperature in atmospheric air by the surface activated bonding method. The Cu substrate electroformed using Au/Cu layer was poorly bonded because Cu atoms diffused through the Au film formed CuO on the surface. In the case of the Au/Ta/Cu seed layer, however, the Cu substrate was strongly bonded because the diffusion of Cu was blocked by the Ta barrier layer. It is expected that this technique will contribute to direct bonding between semiconductor device and heat spreader at room temperature without the use of vacuum bonding equipment.
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