{"title":"使用模拟退火的可变性分析自动化框架","authors":"Aksh Chordia, Surendra Hemaram, J. N. Tripathi","doi":"10.1109/SPI52361.2021.9505204","DOIUrl":null,"url":null,"abstract":"In the design process of integrated circuits, design and process variability plays an important role in the performance of the circuits. In this paper, an automated framework for Variability Analysis of CMOS circuits is proposed using simulated annealing algorithm. A practical study of variability analysis of phase noise in a 2.4 GHz CMOS oscillator is illustrated using this framework. The performance for the proposed framework for Variability Analysis application is validated by comparing it with the conventional Monte Carlo simulations. A significant gain in terms of computational time is reported.","PeriodicalId":440368,"journal":{"name":"2021 IEEE 25th Workshop on Signal and Power Integrity (SPI)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"An Automated Framework for Variability Analysis using Simulated Annealing\",\"authors\":\"Aksh Chordia, Surendra Hemaram, J. N. Tripathi\",\"doi\":\"10.1109/SPI52361.2021.9505204\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the design process of integrated circuits, design and process variability plays an important role in the performance of the circuits. In this paper, an automated framework for Variability Analysis of CMOS circuits is proposed using simulated annealing algorithm. A practical study of variability analysis of phase noise in a 2.4 GHz CMOS oscillator is illustrated using this framework. The performance for the proposed framework for Variability Analysis application is validated by comparing it with the conventional Monte Carlo simulations. A significant gain in terms of computational time is reported.\",\"PeriodicalId\":440368,\"journal\":{\"name\":\"2021 IEEE 25th Workshop on Signal and Power Integrity (SPI)\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-05-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 25th Workshop on Signal and Power Integrity (SPI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SPI52361.2021.9505204\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 25th Workshop on Signal and Power Integrity (SPI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SPI52361.2021.9505204","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An Automated Framework for Variability Analysis using Simulated Annealing
In the design process of integrated circuits, design and process variability plays an important role in the performance of the circuits. In this paper, an automated framework for Variability Analysis of CMOS circuits is proposed using simulated annealing algorithm. A practical study of variability analysis of phase noise in a 2.4 GHz CMOS oscillator is illustrated using this framework. The performance for the proposed framework for Variability Analysis application is validated by comparing it with the conventional Monte Carlo simulations. A significant gain in terms of computational time is reported.