{"title":"Micropac 66183-300光耦合器的质子损伤","authors":"F. Irom, G. Allen, L. Edmonds, B. Rax","doi":"10.1109/RADECS45761.2018.9328715","DOIUrl":null,"url":null,"abstract":"This paper reports proton damage in the Micropac 66183–300 optocoupler and investigates the radiation degradation of the optocoupler current transfer ratio (CTR) and transistor gain, HFE. We present statistical analysis using a one-sided tolerance method on the optocoupler CTR data.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Proton Damage in Micropac 66183-300 Optocoupler\",\"authors\":\"F. Irom, G. Allen, L. Edmonds, B. Rax\",\"doi\":\"10.1109/RADECS45761.2018.9328715\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper reports proton damage in the Micropac 66183–300 optocoupler and investigates the radiation degradation of the optocoupler current transfer ratio (CTR) and transistor gain, HFE. We present statistical analysis using a one-sided tolerance method on the optocoupler CTR data.\",\"PeriodicalId\":248855,\"journal\":{\"name\":\"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)\",\"volume\":\"62 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RADECS45761.2018.9328715\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS45761.2018.9328715","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper reports proton damage in the Micropac 66183–300 optocoupler and investigates the radiation degradation of the optocoupler current transfer ratio (CTR) and transistor gain, HFE. We present statistical analysis using a one-sided tolerance method on the optocoupler CTR data.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
