VLSI内容可寻址文件存储的内置自检

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI:10.1109/TEST.1991.519492

R. Illman, Terry Bird, G. Catlow, S. Clarke, Len Theobald, G. Willetts

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引用次数: 9

摘要

描述了在由四种ASIC设计和商品存储芯片构建的VLSl内容可寻址文件存储(CAFS)系统中实现准详尽BlST的方法。讨论了BIST在系统级的新应用，以提高系统的可靠性和可维护性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Built-in self-test of the VLSI content addressable filestore

The implementation of quasi-exhaustive BlST in a VLSl Content Addressable File Store (CAFS) system built from four ASIC designs and commodity memory chips is described. A novel application of BIST at the system level for improved system reliability and maintenance is discussed.

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1991, Proceedings. International Test Conference

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