用于高速DAC中的故障检测和倾斜调整的波监测器

2015 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT) Pub Date : 2015-08-01 DOI:10.1109/RFIT.2015.7377925

Kojiro Tokonami, Kaoru Kohira, H. Ishikuro

{"title":"用于高速DAC中的故障检测和倾斜调整的波监测器","authors":"Kojiro Tokonami, Kaoru Kohira, H. Ishikuro","doi":"10.1109/RFIT.2015.7377925","DOIUrl":null,"url":null,"abstract":"In this paper, a high-speed current steering DAC with wave monitor circuit is proposed. Comparator-based wave monitor circuit makes it possible to detect a glitch and adjust the skew of each bit digital signal. Fabricated test chip in 40nm-CMOS demonstrates the performance improvement by glitch detection and skew adjusting. At 1GS/sec, the fabricated DAC achieved ENOB of 5.17 bit and power consumption of 2.38mW.","PeriodicalId":422369,"journal":{"name":"2015 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Wave monitor for glitch detection and skew adjusting in high-speed DAC\",\"authors\":\"Kojiro Tokonami, Kaoru Kohira, H. Ishikuro\",\"doi\":\"10.1109/RFIT.2015.7377925\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a high-speed current steering DAC with wave monitor circuit is proposed. Comparator-based wave monitor circuit makes it possible to detect a glitch and adjust the skew of each bit digital signal. Fabricated test chip in 40nm-CMOS demonstrates the performance improvement by glitch detection and skew adjusting. At 1GS/sec, the fabricated DAC achieved ENOB of 5.17 bit and power consumption of 2.38mW.\",\"PeriodicalId\":422369,\"journal\":{\"name\":\"2015 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RFIT.2015.7377925\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFIT.2015.7377925","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

本文提出了一种带波形监测电路的高速电流转向数模转换器。基于比较器的波形监测电路使检测故障和调整每位数字信号的斜度成为可能。在40nm cmos上制作的测试芯片通过毛刺检测和倾斜调节来提高性能。在1GS/秒的速度下，所制造的DAC实现了5.17位的ENOB和2.38mW的功耗。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Wave monitor for glitch detection and skew adjusting in high-speed DAC

In this paper, a high-speed current steering DAC with wave monitor circuit is proposed. Comparator-based wave monitor circuit makes it possible to detect a glitch and adjust the skew of each bit digital signal. Fabricated test chip in 40nm-CMOS demonstrates the performance improvement by glitch detection and skew adjusting. At 1GS/sec, the fabricated DAC achieved ENOB of 5.17 bit and power consumption of 2.38mW.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2015 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)

自引率

0.00%

发文量