{"title":"采用基于红外的直流注入法结合模拟特征分析对故障部件进行定位","authors":"Zhifeng Zhu, Paul Leone","doi":"10.31399/asm.cp.istfa2021p0029","DOIUrl":null,"url":null,"abstract":"\n This article describes a method to integrate Analog Signature Analysis (ASA) into IR based Direct Current Inject method (IRDCI) for Printed Circuit Board Assembly failure analysis, which extends IRDCI application from diagnostic shorted power rails to any measurement locations that show signature differences. Also, it extends the application of component failure modes from electrical short to breakdown or degradation that can be identified by signature comparison and still keep high efficiency to eliminate the needs to guess and remove suspected faulty components one by one from the board to validate.","PeriodicalId":188323,"journal":{"name":"ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Locate faulty components by IR based Direct Current Injection method with Analog Signature Analysis\",\"authors\":\"Zhifeng Zhu, Paul Leone\",\"doi\":\"10.31399/asm.cp.istfa2021p0029\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\n This article describes a method to integrate Analog Signature Analysis (ASA) into IR based Direct Current Inject method (IRDCI) for Printed Circuit Board Assembly failure analysis, which extends IRDCI application from diagnostic shorted power rails to any measurement locations that show signature differences. Also, it extends the application of component failure modes from electrical short to breakdown or degradation that can be identified by signature comparison and still keep high efficiency to eliminate the needs to guess and remove suspected faulty components one by one from the board to validate.\",\"PeriodicalId\":188323,\"journal\":{\"name\":\"ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.31399/asm.cp.istfa2021p0029\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.cp.istfa2021p0029","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Locate faulty components by IR based Direct Current Injection method with Analog Signature Analysis
This article describes a method to integrate Analog Signature Analysis (ASA) into IR based Direct Current Inject method (IRDCI) for Printed Circuit Board Assembly failure analysis, which extends IRDCI application from diagnostic shorted power rails to any measurement locations that show signature differences. Also, it extends the application of component failure modes from electrical short to breakdown or degradation that can be identified by signature comparison and still keep high efficiency to eliminate the needs to guess and remove suspected faulty components one by one from the board to validate.