扫描声学显微镜封装指纹提取集成电路硬件保证

Daniel Johnson, Po-Wei Hsu, Chengjie Xi, N. Asadizanjani
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引用次数: 3

摘要

在美国最近通过的解决芯片短缺的立法和资金的帮助下,半导体行业的供应链正在经历痛苦的增长和芯片开发的进步。然而,它并非没有一些缺点,其中之一是在整个过程中保持对制造质量的控制的挑战。因此,为了保证半导体器件的安全,对硬件进行物理检测是必要的。本文对各种实物检测方法进行了综述,认为扫描声学显微镜(SAM)是一种理想的实物检测方法,可以最大限度地减少赝品的可能性,是大规模检测赝品的可行方案。
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Scanning Acoustic Microscopy Package Fingerprint Extraction for Integrate Circuit Hardware Assurance
The supply chain of the semiconductor industry is experiencing painful growth and advancement in chip development with the help of recently passed U.S legislation and funding to address a chip shortage. However, it is not without some drawbacks, one of which is the challenge of maintaining control over the manufacturing quality throughout the entire process. As a result of this, physical inspection for hardware security is a necessity to assure the semiconductor devices. In this paper, various physical inspection methods are reviewed and scanning acoustic microscopy (SAM) is proved to be the ideal physical inspection method to minimize the possibility of counterfeits which might be the feasible solution in detecting counterfeits on a large scale.
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