{"title":"氧化Cu-Fe-Zn-P引线框架的表面分析","authors":"Shi Chao, Jen-Hsiang Liu, Wei-Chen Huang, Jenn-Ming Song, Po-Yen Shen, Chi-Lin Huang, Lung-Tang Hung, Chin-Huang Chang","doi":"10.23919/ICEP.2019.8733471","DOIUrl":null,"url":null,"abstract":"A precise and efficient method to analyze surface oxide using FTIR and electrochemical reduction was successfully developed in this study. Systematic analyses on surface oxide layer of commercial Cu-Fe-Zn-P (C194) lead frames demonstrate that this integrated analytical method can be applied to decide the variation in oxide type from top surface to subsurface and corresponding layer thickness. The results turned out to be in good agreement with XPS and TEM data.","PeriodicalId":213025,"journal":{"name":"2019 International Conference on Electronics Packaging (ICEP)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Surface Analyses of Oxidized Cu-Fe-Zn-P Lead Frames\",\"authors\":\"Shi Chao, Jen-Hsiang Liu, Wei-Chen Huang, Jenn-Ming Song, Po-Yen Shen, Chi-Lin Huang, Lung-Tang Hung, Chin-Huang Chang\",\"doi\":\"10.23919/ICEP.2019.8733471\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A precise and efficient method to analyze surface oxide using FTIR and electrochemical reduction was successfully developed in this study. Systematic analyses on surface oxide layer of commercial Cu-Fe-Zn-P (C194) lead frames demonstrate that this integrated analytical method can be applied to decide the variation in oxide type from top surface to subsurface and corresponding layer thickness. The results turned out to be in good agreement with XPS and TEM data.\",\"PeriodicalId\":213025,\"journal\":{\"name\":\"2019 International Conference on Electronics Packaging (ICEP)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 International Conference on Electronics Packaging (ICEP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/ICEP.2019.8733471\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International Conference on Electronics Packaging (ICEP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/ICEP.2019.8733471","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Surface Analyses of Oxidized Cu-Fe-Zn-P Lead Frames
A precise and efficient method to analyze surface oxide using FTIR and electrochemical reduction was successfully developed in this study. Systematic analyses on surface oxide layer of commercial Cu-Fe-Zn-P (C194) lead frames demonstrate that this integrated analytical method can be applied to decide the variation in oxide type from top surface to subsurface and corresponding layer thickness. The results turned out to be in good agreement with XPS and TEM data.