倒置扫描传感器安装技术:用于故障分析的低成本的IGBT模块声学扫描

E. J. de La Cruz, Sheenel Karl De La Rea, Stephen McDonough, S. F. Chai
{"title":"倒置扫描传感器安装技术:用于故障分析的低成本的IGBT模块声学扫描","authors":"E. J. de La Cruz, Sheenel Karl De La Rea, Stephen McDonough, S. F. Chai","doi":"10.1109/IPFA.2014.6898152","DOIUrl":null,"url":null,"abstract":"Acoustic Scanning for IGBT modules is a critical process to find anomalies that could lead to field failures. However, the cost to build this capability for failure analysis use is relatively expensive. This paper aims at evaluating a cost effective acoustic scanning technique for IGBT modules suitable for failure.","PeriodicalId":409316,"journal":{"name":"Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","volume":"710 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Inverted scan transducer mount technique: A cost effective acoustic scanning of IGBT modules for failure analysis\",\"authors\":\"E. J. de La Cruz, Sheenel Karl De La Rea, Stephen McDonough, S. F. Chai\",\"doi\":\"10.1109/IPFA.2014.6898152\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Acoustic Scanning for IGBT modules is a critical process to find anomalies that could lead to field failures. However, the cost to build this capability for failure analysis use is relatively expensive. This paper aims at evaluating a cost effective acoustic scanning technique for IGBT modules suitable for failure.\",\"PeriodicalId\":409316,\"journal\":{\"name\":\"Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"volume\":\"710 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-09-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPFA.2014.6898152\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2014.6898152","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

对IGBT模块进行声波扫描是发现可能导致现场故障的异常的关键过程。然而,构建这种用于故障分析的功能的成本相对昂贵。本文旨在评估适用于故障的IGBT模块的低成本声扫描技术。
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Inverted scan transducer mount technique: A cost effective acoustic scanning of IGBT modules for failure analysis
Acoustic Scanning for IGBT modules is a critical process to find anomalies that could lead to field failures. However, the cost to build this capability for failure analysis use is relatively expensive. This paper aims at evaluating a cost effective acoustic scanning technique for IGBT modules suitable for failure.
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