{"title":"用功能故障模型进行VHDL描述的故障诊断","authors":"V. Pitchumani, Pankaj Mayor, N. Radia","doi":"10.1109/TEST.1991.519525","DOIUrl":null,"url":null,"abstract":"This paper describes algorithms for fault diagnosis of computer hardware modeled in VHDL [1,2,3,4]. Given a VHDL description, the compiler creates an internal representation. For fault diagnosis, a hierarchical approach using the stuck-at fault model at the first level and the arbitrary failure model at the second level, is used. The diagnosis algorithm reasons from first principles using constraint suspension.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Fault Diagnosis using Functional Fault Models for VHDL descriptions\",\"authors\":\"V. Pitchumani, Pankaj Mayor, N. Radia\",\"doi\":\"10.1109/TEST.1991.519525\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes algorithms for fault diagnosis of computer hardware modeled in VHDL [1,2,3,4]. Given a VHDL description, the compiler creates an internal representation. For fault diagnosis, a hierarchical approach using the stuck-at fault model at the first level and the arbitrary failure model at the second level, is used. The diagnosis algorithm reasons from first principles using constraint suspension.\",\"PeriodicalId\":272630,\"journal\":{\"name\":\"1991, Proceedings. International Test Conference\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1991, Proceedings. International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1991.519525\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519525","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fault Diagnosis using Functional Fault Models for VHDL descriptions
This paper describes algorithms for fault diagnosis of computer hardware modeled in VHDL [1,2,3,4]. Given a VHDL description, the compiler creates an internal representation. For fault diagnosis, a hierarchical approach using the stuck-at fault model at the first level and the arbitrary failure model at the second level, is used. The diagnosis algorithm reasons from first principles using constraint suspension.