{"title":"全聚合物薄膜晶体管的器件仿真","authors":"C. Detcheverry, M. Matters","doi":"10.1109/ESSDERC.2000.194781","DOIUrl":null,"url":null,"abstract":"This paper presents an analytical model which describes the device characteristics of all-polymer thin-film transistors with channel lengths in the range of 5 to 20 μm. The model contains a limited number of parameters and can be easily implemented in a circuit simulator. In particular, the description of the mobility in the model includes the experimentally observed dependence of the mobility on the gate","PeriodicalId":354721,"journal":{"name":"30th European Solid-State Device Research Conference","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Device simulation of all-polymer thin-film transistors\",\"authors\":\"C. Detcheverry, M. Matters\",\"doi\":\"10.1109/ESSDERC.2000.194781\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an analytical model which describes the device characteristics of all-polymer thin-film transistors with channel lengths in the range of 5 to 20 μm. The model contains a limited number of parameters and can be easily implemented in a circuit simulator. In particular, the description of the mobility in the model includes the experimentally observed dependence of the mobility on the gate\",\"PeriodicalId\":354721,\"journal\":{\"name\":\"30th European Solid-State Device Research Conference\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-09-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"30th European Solid-State Device Research Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSDERC.2000.194781\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"30th European Solid-State Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDERC.2000.194781","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Device simulation of all-polymer thin-film transistors
This paper presents an analytical model which describes the device characteristics of all-polymer thin-film transistors with channel lengths in the range of 5 to 20 μm. The model contains a limited number of parameters and can be easily implemented in a circuit simulator. In particular, the description of the mobility in the model includes the experimentally observed dependence of the mobility on the gate