Tibor Grasser, T. Aichinger, Hans Reisinger, Jacopo Franco, P. Wagner, Michael Nelhiebel, C. Ortolland, B. Kaczer
{"title":"关于NBTI的“永久性”成分","authors":"Tibor Grasser, T. Aichinger, Hans Reisinger, Jacopo Franco, P. Wagner, Michael Nelhiebel, C. Ortolland, B. Kaczer","doi":"10.1109/IIRW.2010.5706472","DOIUrl":null,"url":null,"abstract":"A number of recent publications explain NBTI to be due to a recoverable and a more permanent component. While a lot of information has been gathered on the recoverable component, the permanent component has been somewhat elusive. We demonstrate that oxide defects commonly linked to the recoverable component also form an important contribution to the permanent component of NBTI. As such, they can contribute to both the threshold voltage shift as well as the charge pumping current. Under favorable conditions, the permanent component can show recovery rates comparable to that of the recoverable component.","PeriodicalId":332664,"journal":{"name":"2010 IEEE International Integrated Reliability Workshop Final Report","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"On the ‘permanent’ component of NBTI\",\"authors\":\"Tibor Grasser, T. Aichinger, Hans Reisinger, Jacopo Franco, P. Wagner, Michael Nelhiebel, C. Ortolland, B. Kaczer\",\"doi\":\"10.1109/IIRW.2010.5706472\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A number of recent publications explain NBTI to be due to a recoverable and a more permanent component. While a lot of information has been gathered on the recoverable component, the permanent component has been somewhat elusive. We demonstrate that oxide defects commonly linked to the recoverable component also form an important contribution to the permanent component of NBTI. As such, they can contribute to both the threshold voltage shift as well as the charge pumping current. Under favorable conditions, the permanent component can show recovery rates comparable to that of the recoverable component.\",\"PeriodicalId\":332664,\"journal\":{\"name\":\"2010 IEEE International Integrated Reliability Workshop Final Report\",\"volume\":\"46 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE International Integrated Reliability Workshop Final Report\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IIRW.2010.5706472\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Integrated Reliability Workshop Final Report","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IIRW.2010.5706472","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A number of recent publications explain NBTI to be due to a recoverable and a more permanent component. While a lot of information has been gathered on the recoverable component, the permanent component has been somewhat elusive. We demonstrate that oxide defects commonly linked to the recoverable component also form an important contribution to the permanent component of NBTI. As such, they can contribute to both the threshold voltage shift as well as the charge pumping current. Under favorable conditions, the permanent component can show recovery rates comparable to that of the recoverable component.
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