用一种新方法从温度斜坡试验中提取相变电池的保留特性

2010 IEEE International Memory Workshop Pub Date : 2010-05-16 DOI:10.1109/IMW.2010.5488327

L. Goux, G. Hurkx, X. P. Wang, Romain Delhougne, K. Attenborough, Dirk J. Gravesteijn, Dirk Wouters, J. P. Gonzalez

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摘要

在这项工作中，我们提出了一种基于温度斜坡特性建模的快速可靠评估相变记忆细胞保留特性的新方法。利用这种方法，我们研究了非晶标记的长度和厚度对保持寿命的影响。结果表明，电池结垢对保留性能的影响是有限的。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Extraction of the retention properties of a phase-change cell from temperature-ramp tests using a novel method

In this work we propose a novel method for fast and reliable evaluation of the retention properties of phase-change memory cells, based on the modeling of the temperature-ramp characteristics. Using this method we investigate the influence of the length and thickness of the amorphous mark on the retention lifetime. The results show that the degradation of the retention properties with the cell scaling is limited.

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2010 IEEE International Memory Workshop

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