用于测试评估的结构化自动机识别

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's Pub Date : 1991-04-15 DOI:10.1109/VTEST.1991.208130

K. E. Maadani, J. Geffroy

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引用次数: 5

摘要

提出了一种新颖的测试序列评估方法，应用于由结构-功能模型表示的顺序电路;该方法基于对所研究电路内部模块的形式化识别。为了验证该方法，在PROLOG中实现了一个原型软件工具。

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Identification of structured automata for test evaluation

Presents an original approach to the evaluation of test sequences applied to sequential circuits represented by structured-functional models; the method is based on formal identification of the internal modules of the circuit studied. A prototype software tool has been implemented in PROLOG in order to validate the approach.<>

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Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's

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