{"title":"设备不匹配对汉明距离分类器性能的限制","authors":"N. Kumar, P. Pouliquen, A. Andreou","doi":"10.1109/DFTVS.1993.595829","DOIUrl":null,"url":null,"abstract":"The performance of a memory based computational engine, a Hamming distance classifier that employs static memory cells and an analog Winner-Takes-All circuit depends on device matching in the various parts of the circuit. This dependence has been analyzed, leading to design criteria for choosing the device sizes and chip structure. The theoretical performance of a CMOS chip designed to operate in the subthreshold and transition region has been compared with the actual experimental results.","PeriodicalId":213798,"journal":{"name":"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","volume":"67 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Device mismatch limitations on performance of a Hamming distance classifier\",\"authors\":\"N. Kumar, P. Pouliquen, A. Andreou\",\"doi\":\"10.1109/DFTVS.1993.595829\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The performance of a memory based computational engine, a Hamming distance classifier that employs static memory cells and an analog Winner-Takes-All circuit depends on device matching in the various parts of the circuit. This dependence has been analyzed, leading to design criteria for choosing the device sizes and chip structure. The theoretical performance of a CMOS chip designed to operate in the subthreshold and transition region has been compared with the actual experimental results.\",\"PeriodicalId\":213798,\"journal\":{\"name\":\"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems\",\"volume\":\"67 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-10-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1993.595829\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1993.595829","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Device mismatch limitations on performance of a Hamming distance classifier
The performance of a memory based computational engine, a Hamming distance classifier that employs static memory cells and an analog Winner-Takes-All circuit depends on device matching in the various parts of the circuit. This dependence has been analyzed, leading to design criteria for choosing the device sizes and chip structure. The theoretical performance of a CMOS chip designed to operate in the subthreshold and transition region has been compared with the actual experimental results.
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