应用基于协方差的模型拟合响应面与实验数据

M. Redford, A. J. Walton, D. Sprevak, R. S. Ferguson
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引用次数: 2

摘要

实验设计和响应面方法(RSM)是可以用来帮助优化集成电路过程的重要工具(Walton等,1997)。本文提出了一种对实验数据进行响应曲面拟合的方法,当有一个或多个数据点不能用传统的多项式模型拟合时。该方法基于首先用多项式模型拟合数据,并使用该模型计算原始实验中使用的控制因素组合的工作表。然后将拟合不良点的实际实验条件替换到此工作表中,并使用协方差拟合来拟合数据。所得曲面遵循一般趋势,同时也拟合测量点,其中有信心没有显著的实验误差。
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Application of covariance based models to fit response surfaces to experimental data
Experimental design together with the response surface methodology (RSM) are important tools that can be employed to help optimise IC processes (Walton et al, 1997). This paper presents a method of fitting a response surface to experimental data when there are one or more data points that are poorly fitted by conventional polynomial models. The method is based on first fitting the data with a polynomial model and using this to calculate a worksheet for the combinations of control factors that were used in the original experiment. The actual experimental conditions for the poorly fitting points are then substituted into this worksheet and a covariance fit used to fit the data. The resulting surface follows the general trend while also fitting measurement points where there is confidence that there is no significant experimental error.
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