下一代功率模块用氮化硅绝缘衬底的高温介电性能可达350摄氏度。

Tsuyoshi Abe, Y. Nishigaki, M. Kozako, M. Hikita
{"title":"下一代功率模块用氮化硅绝缘衬底的高温介电性能可达350摄氏度。","authors":"Tsuyoshi Abe, Y. Nishigaki, M. Kozako, M. Hikita","doi":"10.23919/ICEP.2019.8733529","DOIUrl":null,"url":null,"abstract":"Recently, as power module tends to have higher output density, large-capacity and downsizing of the module are demanded. It also tends to operate at higher temperatures. From the above circumstances, evaluation of high temperature electrical properties of ceramic insulating substrates for application of next generation power module becomes important. However, there are very few reports on the high temperature insulation property of the ceramic insulating substrate. This paper presents dielectric properties (relative permittivity εr´, relative dielectric loss factor εr″ and AC conductivity σac) of ceramic insulating substrate consisting of Silicon Nitride (Si3N4) used for next generation power module up to high temperature of 350 °C. Besides, DC conductivity σdc are evaluated as a function of the temperature of the substrate, from which the activation energy Ea was calculated. Thus obtained results are discussed with the temperature dependence of the permittivity and ac conductivity considered. An attempt is also made to evaluate specific properties of the Si3N4 substrate by comparing with the dielectric properties of Aluminum Nitride (A1N) substrate.","PeriodicalId":213025,"journal":{"name":"2019 International Conference on Electronics Packaging (ICEP)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"High temperature dielectric property of silicon nitride insulating substrate for next generation power module up to 350 degrees Celsius.\",\"authors\":\"Tsuyoshi Abe, Y. Nishigaki, M. Kozako, M. Hikita\",\"doi\":\"10.23919/ICEP.2019.8733529\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Recently, as power module tends to have higher output density, large-capacity and downsizing of the module are demanded. It also tends to operate at higher temperatures. From the above circumstances, evaluation of high temperature electrical properties of ceramic insulating substrates for application of next generation power module becomes important. However, there are very few reports on the high temperature insulation property of the ceramic insulating substrate. This paper presents dielectric properties (relative permittivity εr´, relative dielectric loss factor εr″ and AC conductivity σac) of ceramic insulating substrate consisting of Silicon Nitride (Si3N4) used for next generation power module up to high temperature of 350 °C. Besides, DC conductivity σdc are evaluated as a function of the temperature of the substrate, from which the activation energy Ea was calculated. Thus obtained results are discussed with the temperature dependence of the permittivity and ac conductivity considered. An attempt is also made to evaluate specific properties of the Si3N4 substrate by comparing with the dielectric properties of Aluminum Nitride (A1N) substrate.\",\"PeriodicalId\":213025,\"journal\":{\"name\":\"2019 International Conference on Electronics Packaging (ICEP)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 International Conference on Electronics Packaging (ICEP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/ICEP.2019.8733529\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International Conference on Electronics Packaging (ICEP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/ICEP.2019.8733529","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

近年来,随着功率模块输出密度的不断提高,对功率模块的大容量和小型化提出了更高的要求。它也倾向于在更高的温度下工作。在上述情况下,评估用于下一代功率模块的陶瓷绝缘基板的高温电性能变得非常重要。然而,关于陶瓷绝缘衬底的高温绝缘性能的报道很少。本文研究了下一代功率模块用氮化硅(Si3N4)陶瓷绝缘衬底在350℃高温下的介电性能(相对介电常数εr´,相对介电损耗因子εr″和交流电导率σac)。此外,还计算了直流电导率σdc随衬底温度的变化规律,并由此计算了活化能Ea。因此,讨论所得结果时考虑了介电常数和交流电导率的温度依赖性。通过与氮化铝(A1N)衬底的介电性能的比较,对氮化硅衬底的性能进行了评价。
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High temperature dielectric property of silicon nitride insulating substrate for next generation power module up to 350 degrees Celsius.
Recently, as power module tends to have higher output density, large-capacity and downsizing of the module are demanded. It also tends to operate at higher temperatures. From the above circumstances, evaluation of high temperature electrical properties of ceramic insulating substrates for application of next generation power module becomes important. However, there are very few reports on the high temperature insulation property of the ceramic insulating substrate. This paper presents dielectric properties (relative permittivity εr´, relative dielectric loss factor εr″ and AC conductivity σac) of ceramic insulating substrate consisting of Silicon Nitride (Si3N4) used for next generation power module up to high temperature of 350 °C. Besides, DC conductivity σdc are evaluated as a function of the temperature of the substrate, from which the activation energy Ea was calculated. Thus obtained results are discussed with the temperature dependence of the permittivity and ac conductivity considered. An attempt is also made to evaluate specific properties of the Si3N4 substrate by comparing with the dielectric properties of Aluminum Nitride (A1N) substrate.
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