具有垂直双扩散MOS输出器件的智能功率集成电路的新型SOI结构

H. Kikuchi, T. Hamajima, K. Kobayashi, M. Takashi, K. Arai
{"title":"具有垂直双扩散MOS输出器件的智能功率集成电路的新型SOI结构","authors":"H. Kikuchi, T. Hamajima, K. Kobayashi, M. Takashi, K. Arai","doi":"10.1109/SOI.1995.526496","DOIUrl":null,"url":null,"abstract":"Intelligent power ICs with vertical double-diffused MOS (VDMOS) output devices are used for solenoid controlled applications. Many structures have been proposed for these power ICs. We have developed poly-Si sandwiched bonded (PSB) structures which use a Sb doped poly-Si and crystal-Si bonding technique. However these PSB structures have a high fabrication cost, because the fabrication process includes Sb diffusion into poly-Si layers. In this paper, we first propose an improved fabrication process of PSB structures without Sb diffusion into poly-Si layers. Second, we propose a new SOI structure with gaps fabricated by a wafer direct bonding technique. Both structures enable us to obtain low-cost intelligent power ICs with VDMOS.","PeriodicalId":149490,"journal":{"name":"1995 IEEE International SOI Conference Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1995-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"New SOI structures for intelligent power ICs with vertical double-diffused MOS output devices\",\"authors\":\"H. Kikuchi, T. Hamajima, K. Kobayashi, M. Takashi, K. Arai\",\"doi\":\"10.1109/SOI.1995.526496\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Intelligent power ICs with vertical double-diffused MOS (VDMOS) output devices are used for solenoid controlled applications. Many structures have been proposed for these power ICs. We have developed poly-Si sandwiched bonded (PSB) structures which use a Sb doped poly-Si and crystal-Si bonding technique. However these PSB structures have a high fabrication cost, because the fabrication process includes Sb diffusion into poly-Si layers. In this paper, we first propose an improved fabrication process of PSB structures without Sb diffusion into poly-Si layers. Second, we propose a new SOI structure with gaps fabricated by a wafer direct bonding technique. Both structures enable us to obtain low-cost intelligent power ICs with VDMOS.\",\"PeriodicalId\":149490,\"journal\":{\"name\":\"1995 IEEE International SOI Conference Proceedings\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-10-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1995 IEEE International SOI Conference Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SOI.1995.526496\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1995 IEEE International SOI Conference Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SOI.1995.526496","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

具有垂直双扩散MOS (VDMOS)输出器件的智能功率ic用于电磁控制应用。对于这些功率集成电路,已经提出了许多结构。我们利用掺杂锑的多晶硅和晶体硅键合技术开发了多晶硅夹层键合(PSB)结构。然而,这些PSB结构的制造成本很高,因为制造过程包括Sb扩散到多晶硅层。在本文中,我们首次提出了一种改进的PSB结构的制造工艺,使Sb不扩散到多晶硅层中。其次,我们提出了一种新的SOI结构,通过晶圆直接键合技术制造间隙。这两种结构都使我们能够获得具有VDMOS的低成本智能功率ic。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
New SOI structures for intelligent power ICs with vertical double-diffused MOS output devices
Intelligent power ICs with vertical double-diffused MOS (VDMOS) output devices are used for solenoid controlled applications. Many structures have been proposed for these power ICs. We have developed poly-Si sandwiched bonded (PSB) structures which use a Sb doped poly-Si and crystal-Si bonding technique. However these PSB structures have a high fabrication cost, because the fabrication process includes Sb diffusion into poly-Si layers. In this paper, we first propose an improved fabrication process of PSB structures without Sb diffusion into poly-Si layers. Second, we propose a new SOI structure with gaps fabricated by a wafer direct bonding technique. Both structures enable us to obtain low-cost intelligent power ICs with VDMOS.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Analytical threshold voltage model for short channel n/sup +/-p/sup +/ double-gate SOI MOSFETs Front and back gate interface-trap generation due to hot carrier stress in fully depleted SOI/MOSFETs SOI material characterization using optical second harmonic generation Minimum parasitic resistance for ultra-thin SOI MOSFET with high-permittivity gate insulator performed by lateral contact structure Transient effects in floating body SOI NMOSFETs
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1