G. Capellini, C. Reich, S. Guha, Y. Yamamoto, S. Lischke, J. Kreissl, L. Zimmermann, M. Virgilio, A. Ghrib, M. El Kurdi, P. Boucaud, B. Tillack, T. Schroeder
{"title":"面向边缘发射激光器的cmos制备拉伸锗微结构","authors":"G. Capellini, C. Reich, S. Guha, Y. Yamamoto, S. Lischke, J. Kreissl, L. Zimmermann, M. Virgilio, A. Ghrib, M. El Kurdi, P. Boucaud, B. Tillack, T. Schroeder","doi":"10.1109/ISTDM.2014.6874627","DOIUrl":null,"url":null,"abstract":"The realization of a Si-integrated light source represents today the \"Holy Grail\" of silicon photonics. An approach based on slightly tensile strained Ge/Si heterostructures has led to the demonstration of both optically and electrically pumped laser. This achievement has been welcomed by the scientific community as a leap toward a monolithically integrated silicon-based photonic platform. In this talk, a CMOS-based fabrication approach to obtain Ge microstripes on SOI substrates featuring uniaxial strain values up to -~1.5 % , resulting in an equivalent biaxial tensile strain value up to ε~9x10-3 is presented.","PeriodicalId":371483,"journal":{"name":"2014 7th International Silicon-Germanium Technology and Device Meeting (ISTDM)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"CMOS-fabricated tensile Ge microstructures: towards an edge-emitting laser\",\"authors\":\"G. Capellini, C. Reich, S. Guha, Y. Yamamoto, S. Lischke, J. Kreissl, L. Zimmermann, M. Virgilio, A. Ghrib, M. El Kurdi, P. Boucaud, B. Tillack, T. Schroeder\",\"doi\":\"10.1109/ISTDM.2014.6874627\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The realization of a Si-integrated light source represents today the \\\"Holy Grail\\\" of silicon photonics. An approach based on slightly tensile strained Ge/Si heterostructures has led to the demonstration of both optically and electrically pumped laser. This achievement has been welcomed by the scientific community as a leap toward a monolithically integrated silicon-based photonic platform. In this talk, a CMOS-based fabrication approach to obtain Ge microstripes on SOI substrates featuring uniaxial strain values up to -~1.5 % , resulting in an equivalent biaxial tensile strain value up to ε~9x10-3 is presented.\",\"PeriodicalId\":371483,\"journal\":{\"name\":\"2014 7th International Silicon-Germanium Technology and Device Meeting (ISTDM)\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-06-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 7th International Silicon-Germanium Technology and Device Meeting (ISTDM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISTDM.2014.6874627\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 7th International Silicon-Germanium Technology and Device Meeting (ISTDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISTDM.2014.6874627","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
CMOS-fabricated tensile Ge microstructures: towards an edge-emitting laser
The realization of a Si-integrated light source represents today the "Holy Grail" of silicon photonics. An approach based on slightly tensile strained Ge/Si heterostructures has led to the demonstration of both optically and electrically pumped laser. This achievement has been welcomed by the scientific community as a leap toward a monolithically integrated silicon-based photonic platform. In this talk, a CMOS-based fabrication approach to obtain Ge microstripes on SOI substrates featuring uniaxial strain values up to -~1.5 % , resulting in an equivalent biaxial tensile strain value up to ε~9x10-3 is presented.