P. Dehkordi, K. Ramamurthi, D. Bouldin, H. Davidson
{"title":"确定最佳MCM系统的区域阵列键间距:一个案例研究","authors":"P. Dehkordi, K. Ramamurthi, D. Bouldin, H. Davidson","doi":"10.1109/MCMC.1997.569338","DOIUrl":null,"url":null,"abstract":"Microelectronics system designers need to understand and evaluate the impact of advanced packaging parameters which have become an integral part of microelectronics systems. This paper evaluates the impact of bond pitch for a flipchip multichip system through a case study. The SUN MicroSparc CPU was used as a representative of a large design where the design has to be partitioned and interconnected using MCM technology. Early analysis techniques were used to analyze the design for various pitches ranging from 150 to 400 micron in 50 micron increments. Results suggest that various bond pitches affect the system cost/performance and there is a minimum pitch at which lowering the pitch will degrade the cost/performance metrics.","PeriodicalId":412444,"journal":{"name":"Proceedings 1997 IEEE Multi-Chip Module Conference","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-02-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Determination of area-array bond pitch for optimum MCM systems: a case study\",\"authors\":\"P. Dehkordi, K. Ramamurthi, D. Bouldin, H. Davidson\",\"doi\":\"10.1109/MCMC.1997.569338\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Microelectronics system designers need to understand and evaluate the impact of advanced packaging parameters which have become an integral part of microelectronics systems. This paper evaluates the impact of bond pitch for a flipchip multichip system through a case study. The SUN MicroSparc CPU was used as a representative of a large design where the design has to be partitioned and interconnected using MCM technology. Early analysis techniques were used to analyze the design for various pitches ranging from 150 to 400 micron in 50 micron increments. Results suggest that various bond pitches affect the system cost/performance and there is a minimum pitch at which lowering the pitch will degrade the cost/performance metrics.\",\"PeriodicalId\":412444,\"journal\":{\"name\":\"Proceedings 1997 IEEE Multi-Chip Module Conference\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-02-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1997 IEEE Multi-Chip Module Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MCMC.1997.569338\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1997 IEEE Multi-Chip Module Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MCMC.1997.569338","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Determination of area-array bond pitch for optimum MCM systems: a case study
Microelectronics system designers need to understand and evaluate the impact of advanced packaging parameters which have become an integral part of microelectronics systems. This paper evaluates the impact of bond pitch for a flipchip multichip system through a case study. The SUN MicroSparc CPU was used as a representative of a large design where the design has to be partitioned and interconnected using MCM technology. Early analysis techniques were used to analyze the design for various pitches ranging from 150 to 400 micron in 50 micron increments. Results suggest that various bond pitches affect the system cost/performance and there is a minimum pitch at which lowering the pitch will degrade the cost/performance metrics.