确定最佳MCM系统的区域阵列键间距:一个案例研究

P. Dehkordi, K. Ramamurthi, D. Bouldin, H. Davidson
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引用次数: 0

摘要

微电子系统设计人员需要了解和评估先进封装参数的影响,这些参数已成为微电子系统不可或缺的一部分。本文通过实例分析了键距对倒装多芯片系统的影响。SUN MicroSparc CPU被用作大型设计的代表,其中设计必须使用MCM技术进行分区和互连。早期的分析技术用于以50微米的增量分析150到400微米的各种间距的设计。结果表明,不同的粘合间距会影响系统的成本/性能,并且存在一个最小间距,降低间距会降低成本/性能指标。
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Determination of area-array bond pitch for optimum MCM systems: a case study
Microelectronics system designers need to understand and evaluate the impact of advanced packaging parameters which have become an integral part of microelectronics systems. This paper evaluates the impact of bond pitch for a flipchip multichip system through a case study. The SUN MicroSparc CPU was used as a representative of a large design where the design has to be partitioned and interconnected using MCM technology. Early analysis techniques were used to analyze the design for various pitches ranging from 150 to 400 micron in 50 micron increments. Results suggest that various bond pitches affect the system cost/performance and there is a minimum pitch at which lowering the pitch will degrade the cost/performance metrics.
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