基于CuO/Al反应性多层体系的反应芯片级键合

K. Vogel, Ralph Schachler, F. Roscher, M. Wiemer, H. Kuhn
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摘要

反应键合是一种新的创新技术,可以在室温下在几秒钟内完成晶圆、芯片和组件的键合。CuO/Al反应性多层体系在光学微系统的晶圆级和芯片级封装中具有很大的内热源潜力。材料从晶圆到芯片级的转移使得无需额外的加热和冷却步骤即可快速集成。反应的点火可以通过直接火花或激光点火以及间接电势点火来实现。光学系统中对粒子自由键合的要求也有利于间接点火。此外,薄片粘结硅玻璃样品的抗剪强度强烈依赖于成功的楔形补偿,使平均抗剪强度增加37%。
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Reactive chip level bonding based on CuO/Al reactive multilayer systems
Reactive bonding is a new innovative technology for room temperature bonding of wafers chips and components within seconds. The CuO/Al reactive multilayer system shows great potential as internal heat source for wafer and chip level packaging of optical microsystems. The transfer of the material from wafer to chip level enables a fast integration without additional heating and cooling steps. The ignition of the reaction can be achieved by direct spark or laser ignition as well as indirect potential based ignition. The demand for particle free bonding in optical systems also favors the indirect ignition. Furthermore, the shear strength of the chip bonded Si-glass samples strongly depends on a successful wedge compensation, enabling an increase of the average shear strength by 37 %.
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