{"title":"tec -实验室-符合EN ISO/ iec17025的电子元件和系统的认可电离辐射暴露","authors":"P. Beck, M. Wind, M. Latocha, Christoph Tscherne","doi":"10.1109/RADECS45761.2018.9328729","DOIUrl":null,"url":null,"abstract":"We discuss EN ISO/IEC 17025 accreditation requirements for the TEC-Laboratory with regard to ionizing radiation exposure of electronic components and systems at Seibersdorf Laboratories. We present investigations of the uniformity of the Cobalt-60 irradiation field as well as photon backscatter from the concrete walls and within a lead box.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"TEC-Laboratory - Accredited Ionizing Radiation Exposure of Electronic Components and Systems Compliant with EN ISO/IEC 17025\",\"authors\":\"P. Beck, M. Wind, M. Latocha, Christoph Tscherne\",\"doi\":\"10.1109/RADECS45761.2018.9328729\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We discuss EN ISO/IEC 17025 accreditation requirements for the TEC-Laboratory with regard to ionizing radiation exposure of electronic components and systems at Seibersdorf Laboratories. We present investigations of the uniformity of the Cobalt-60 irradiation field as well as photon backscatter from the concrete walls and within a lead box.\",\"PeriodicalId\":248855,\"journal\":{\"name\":\"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RADECS45761.2018.9328729\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS45761.2018.9328729","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
TEC-Laboratory - Accredited Ionizing Radiation Exposure of Electronic Components and Systems Compliant with EN ISO/IEC 17025
We discuss EN ISO/IEC 17025 accreditation requirements for the TEC-Laboratory with regard to ionizing radiation exposure of electronic components and systems at Seibersdorf Laboratories. We present investigations of the uniformity of the Cobalt-60 irradiation field as well as photon backscatter from the concrete walls and within a lead box.
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