THERMIC:用于再生暴露于电离辐射的CMOS电路的硬化温度控制器

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2018-09-01 DOI:10.1109/RADECS45761.2018.9328696

J. Armani, Alejandro Ureña-Acuña, Philippe Dollfus, M. Slimani

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引用次数: 2

摘要

一种旨在再生CMOS电路的辐射硬化温度控制器已经设计使用商业现成的组件。用60Co伽马射线测试，它的辐射硬度大于65kgy。通过这些结果验证了用于设计温度控制器的硬化方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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THERMIC: a Hardened Temperature Controller for Regenerating CMOS Circuits Exposed to Ionizing Radiation

A Radiation hardened temperature controller intended to regenerate CMOS circuits has been designed using commercial off-the-shelf components. Tested with 60Co gamma rays, it has shown a radiation hardness greater than 65 kGy. The hardening methodology used to design the temperature controller is validated through these results.

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2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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