{"title":"用于边界扫描互连测试的工作站环境","authors":"T. Moore","doi":"10.1109/TEST.1991.519779","DOIUrl":null,"url":null,"abstract":"The testing of logic devices incorporating boundary scan with the IEEE 1149.1 standard has been shown to be a practical method to test and diagnose loaded board interconnect. A highly flexible workstation based boundary scan interconnect tesr system has been used to provide low cost interconnect verification. This paper will describe the suite of tools, their integration, and their application to diFerent test requirements.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A WORKSTATION ENVIRONMENT FOR BOUNDARY SCAN INTERCONNECT TESTING\",\"authors\":\"T. Moore\",\"doi\":\"10.1109/TEST.1991.519779\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The testing of logic devices incorporating boundary scan with the IEEE 1149.1 standard has been shown to be a practical method to test and diagnose loaded board interconnect. A highly flexible workstation based boundary scan interconnect tesr system has been used to provide low cost interconnect verification. This paper will describe the suite of tools, their integration, and their application to diFerent test requirements.\",\"PeriodicalId\":272630,\"journal\":{\"name\":\"1991, Proceedings. International Test Conference\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1991, Proceedings. International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1991.519779\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519779","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A WORKSTATION ENVIRONMENT FOR BOUNDARY SCAN INTERCONNECT TESTING
The testing of logic devices incorporating boundary scan with the IEEE 1149.1 standard has been shown to be a practical method to test and diagnose loaded board interconnect. A highly flexible workstation based boundary scan interconnect tesr system has been used to provide low cost interconnect verification. This paper will describe the suite of tools, their integration, and their application to diFerent test requirements.
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