8位微控制器ATmega128和AT90CAN128的辐射测试

2010 IEEE Radiation Effects Data Workshop Pub Date : 2010-07-20 DOI:10.1109/REDW.2010.5619504

A. Schuttauf, S. Rakers, C. Daniel

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引用次数: 3

摘要

我们对ATmega128和AT90CAN128微控制器进行了重离子测试。这些COTS设备对SEL/SEU错误表现出完全不同的敏感性，其中电流消耗表现出类似步骤的行为。给出了详细的测量、分析和在轨速率。

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Radiation Test of 8 Bit Microcontrollers ATmega128 & AT90CAN128

We have performed heavy ion tests of the ATmega128 and AT90CAN128 micro controller. These COTS devices have shown a quite different sensitivity to SEL/SEU errors, where the current consumption showed a step like behaviour. Detailed measurements, analyses and on-orbit rates are presented.

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2010 IEEE Radiation Effects Data Workshop

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