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引用次数: 1

摘要

在过去的几年中,对半导体器件的可靠性要求大大增加。然而,产品鉴定仍然由标准的压力测试程序主导。尽管最近讨论了改进的方法,但是单独的测试不足以证明非常低的故障率。理解设备的行为和物理建模是必不可少的。仿真在这项工作中起着关键作用。
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Reliability of semiconductor devices - The need for simulation
Reliability requirements for semiconductor devices have increased tremendously in the past years. However, product qualification is still dominated by standard stress test procedures. Despite improved approaches that have entered the discussion recently, testing alone will not suffice to prove very low failure rates. Understanding of the device behaviour together with physical modelling is indispensable. Simulation plays a key role in this undertaking.
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