双极器件超低剂量率ELDRS加速试验

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2018-09-01 DOI:10.1109/RADECS45761.2018.9328666

X. Wang, W. Lu, S. Yao, X.L. Li, Q. Guo, C. He, X. Yu, J. Sun

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摘要

我们提出了在超低剂量率(< 10mrad(Si)/s)下双极器件中ELDRS的温度开关照射(TSI)试验的加速评估结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Accelerated Test of ELDRS at Ultra-Low Dose Rates for Bipolar Devices

We present accelerated evaluation results of temperature-switching irradiation (TSI) test for ELDRS in bipolar devices at ultra-low dose rates(< 10mrad(Si)/s).

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2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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