{"title":"偶极子平面阵列中的随机效应","authors":"A. Adams, P. Hsi, A. Farrar","doi":"10.1109/ISEMC.1976.7568741","DOIUrl":null,"url":null,"abstract":"A computer program for the analysis of random effects in planar arrays is described. The method of moments is applied iteratively in conjunc tion with a random sampling process, to obtain mean far field beam patterns and their expected variation. Block-Toeplitz impedance redundancies and the zeros of the excitation matrix are utilized in a special effi cient solution routine. Separate array analysis at fundamental and harmonic frequencies yields the ex pected ratio of harmonic to fundamental levels. The theory of the computer program is outlined and typical results are presented. Significant gain degradation is predicted at harmonic frequencies.","PeriodicalId":296335,"journal":{"name":"IEEE 1976 International Symposium on Electromagnetic Compatibility","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1976-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Random Effects in Planar Arrays of Dipoles\",\"authors\":\"A. Adams, P. Hsi, A. Farrar\",\"doi\":\"10.1109/ISEMC.1976.7568741\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A computer program for the analysis of random effects in planar arrays is described. The method of moments is applied iteratively in conjunc tion with a random sampling process, to obtain mean far field beam patterns and their expected variation. Block-Toeplitz impedance redundancies and the zeros of the excitation matrix are utilized in a special effi cient solution routine. Separate array analysis at fundamental and harmonic frequencies yields the ex pected ratio of harmonic to fundamental levels. The theory of the computer program is outlined and typical results are presented. Significant gain degradation is predicted at harmonic frequencies.\",\"PeriodicalId\":296335,\"journal\":{\"name\":\"IEEE 1976 International Symposium on Electromagnetic Compatibility\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1976-07-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 1976 International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1976.7568741\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1976 International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1976.7568741","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A computer program for the analysis of random effects in planar arrays is described. The method of moments is applied iteratively in conjunc tion with a random sampling process, to obtain mean far field beam patterns and their expected variation. Block-Toeplitz impedance redundancies and the zeros of the excitation matrix are utilized in a special effi cient solution routine. Separate array analysis at fundamental and harmonic frequencies yields the ex pected ratio of harmonic to fundamental levels. The theory of the computer program is outlined and typical results are presented. Significant gain degradation is predicted at harmonic frequencies.