{"title":"有机场控晶体管的小电流测量","authors":"V. Režo, M. Hanic, M. Weis","doi":"10.1109/ASDAM55965.2022.9966746","DOIUrl":null,"url":null,"abstract":"This paper presents the practical solutions for measuring small currents at the characterization of organic field-controlled transistors. It presents the design, PCB layout, and methodology of various small current measurement principles. The design mainly focuses on a trans-impedance amplifier that transforms current into voltage. In this paper, we can also determine the critical parameters for selecting the main components in the measuring part. Also, simulations and measurement of real measured parameters with an evaluation of all critical quantities, such as accuracy, precision, linearity, offset, noise, and response speed.","PeriodicalId":148302,"journal":{"name":"2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Small currents measurement in organic field-controlled transistors\",\"authors\":\"V. Režo, M. Hanic, M. Weis\",\"doi\":\"10.1109/ASDAM55965.2022.9966746\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the practical solutions for measuring small currents at the characterization of organic field-controlled transistors. It presents the design, PCB layout, and methodology of various small current measurement principles. The design mainly focuses on a trans-impedance amplifier that transforms current into voltage. In this paper, we can also determine the critical parameters for selecting the main components in the measuring part. Also, simulations and measurement of real measured parameters with an evaluation of all critical quantities, such as accuracy, precision, linearity, offset, noise, and response speed.\",\"PeriodicalId\":148302,\"journal\":{\"name\":\"2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASDAM55965.2022.9966746\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASDAM55965.2022.9966746","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Small currents measurement in organic field-controlled transistors
This paper presents the practical solutions for measuring small currents at the characterization of organic field-controlled transistors. It presents the design, PCB layout, and methodology of various small current measurement principles. The design mainly focuses on a trans-impedance amplifier that transforms current into voltage. In this paper, we can also determine the critical parameters for selecting the main components in the measuring part. Also, simulations and measurement of real measured parameters with an evaluation of all critical quantities, such as accuracy, precision, linearity, offset, noise, and response speed.