14.5 A 1.22ps集成抖动0.25- 4ghz分数n ADPLL, 16nm FinFET CM0S

Tsung-Hsien Tsai, Min-Shueh Yuan, Chih-Hsien Chang, Chia-Chun Liao, Chao-Chieh Li, R. Staszewski
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引用次数: 30

摘要

与模拟锁相环相比,全数字锁相环(adpll)在先进的半导体工艺中提供更快的锁定时间,更容易携带和更好的性能。先进的FinFET器件比平面器件[1]表现出更好的gm和ION,但它们只能在有限数量的器件尺寸中提供,因此无法在传统的模拟设计风格中使用。在ADPLL中,晶体管被用作开关,很少考虑其线性模拟特性。因此,ADPLL的性能应该随着FinFET器件的采用而提高。16nm FinFET工艺的逆变器延迟不到28nm平面工艺的一半,将带内相位噪声(PN)提高了约6dB[2]。环型数字控制振荡器(dco)提供宽频率调谐范围(FTR),但PN性能差会降低ADPLL的质量因数(FoM)[3]。使用环形DCO实现优于-225dB的FoM是一个挑战。在这项工作中,我们在16nm FinFET CMOS中提出了0.25至4ghz, 1.22ps集成抖动和-228.6dB FoM分数n ADPLL,具有扩频时钟(SSC)能力。
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14.5 A 1.22ps integrated-jitter 0.25-to-4GHz fractional-N ADPLL in 16nm FinFET CM0S
All-digital phase-locked loops (ADPLLs) offer faster locking time, easier portability and better performance in advanced semiconductor processes as compared to analog PLLs. Advanced FinFET devices exhibit better gm and ION than planar devices [1], but they are offered only in a limited number of device sizes, thus precluding their use in traditional analog design styles. In an ADPLL, the transistors are used as switches with little regard to their linear analog properties. Hence, ADPLL performance should improve with the adoption of FinFET devices. Inverter delay in a 16nm FinFET process is less than half of that in a 28nm planar process, improving in-band phase noise (PN) by around 6dB [2]. Ring-type digitally controlled oscillators (DCOs) provide wide frequency tuning range (FTR), but poor PN performance degrades the ADPLL figure of merit (FoM) [3]. Achieving an FoM better than -225dB using a ring DCO is a challenge. In this work, we presenta 0.25-to-4GHz, 1.22ps integrated jitter and -228.6dB FoM fractional-N ADPLL with spread-spectrum clocking (SSC) capability in 16nm FinFET CMOS.
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