多门控器件体系结构的进步、优势和挑战

L. Mathew, Yang Du, A. Thean, M. Sadd, A. Vandooren, C. Parker, T. Stephens, R. Mora, R. Rai, M. Zavala, D. Sing, S. Kalpai, J. Hughes, R. Shimer, S. Jallepalli, G. Workman, B. White, B. Nguyen, A. Mogab
{"title":"多门控器件体系结构的进步、优势和挑战","authors":"L. Mathew, Yang Du, A. Thean, M. Sadd, A. Vandooren, C. Parker, T. Stephens, R. Mora, R. Rai, M. Zavala, D. Sing, S. Kalpai, J. Hughes, R. Shimer, S. Jallepalli, G. Workman, B. White, B. Nguyen, A. Mogab","doi":"10.1109/ICICDT.2004.1309916","DOIUrl":null,"url":null,"abstract":"Device architectures incorporating multiple gate structures have been proposed to allow transistor scaling beyond the planar MCSFET integrations. These device architectures can improve performance such as better short channel performance and reduced leakage. In addition the additional channel surface and gate electrodes offers new circuit possibilities such as dynamic threshold voltage control and an RF mixer are demonstrated. It is desirable to fabricate multi-gated devices with the single gate on multiple sides and multiple gate electrodes this has been demonstrated successfully.","PeriodicalId":158994,"journal":{"name":"2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Multi gated device architectures advances, advantages and challenges\",\"authors\":\"L. Mathew, Yang Du, A. Thean, M. Sadd, A. Vandooren, C. Parker, T. Stephens, R. Mora, R. Rai, M. Zavala, D. Sing, S. Kalpai, J. Hughes, R. Shimer, S. Jallepalli, G. Workman, B. White, B. Nguyen, A. Mogab\",\"doi\":\"10.1109/ICICDT.2004.1309916\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Device architectures incorporating multiple gate structures have been proposed to allow transistor scaling beyond the planar MCSFET integrations. These device architectures can improve performance such as better short channel performance and reduced leakage. In addition the additional channel surface and gate electrodes offers new circuit possibilities such as dynamic threshold voltage control and an RF mixer are demonstrated. It is desirable to fabricate multi-gated devices with the single gate on multiple sides and multiple gate electrodes this has been demonstrated successfully.\",\"PeriodicalId\":158994,\"journal\":{\"name\":\"2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-10-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICICDT.2004.1309916\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICICDT.2004.1309916","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

包含多个栅极结构的器件架构已被提出,以允许晶体管超越平面mcfet集成。这些器件架构可以提高性能,例如更好的短通道性能和减少泄漏。此外,额外的通道表面和栅极提供了新的电路可能性,例如动态阈值电压控制和射频混频器。制造多侧单极和多栅电极的多门控器件是理想的,这已经成功地证明了。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Multi gated device architectures advances, advantages and challenges
Device architectures incorporating multiple gate structures have been proposed to allow transistor scaling beyond the planar MCSFET integrations. These device architectures can improve performance such as better short channel performance and reduced leakage. In addition the additional channel surface and gate electrodes offers new circuit possibilities such as dynamic threshold voltage control and an RF mixer are demonstrated. It is desirable to fabricate multi-gated devices with the single gate on multiple sides and multiple gate electrodes this has been demonstrated successfully.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Atmospheric neutron effects in advanced microelectronics, standards and applications Monitoring and preventing arc-induced wafer damage in 300mm manufacturing A study of SiN cap NH/sub 3/ plasma pre-treatment process on the PID, EM, GOI performance and BEOL defectivity in Cu dual damascene technology Low-K cu damascene interconnection leakage and process induced damage assessment Advanced germanium MOSFET technologies with high-/spl kappa/ gate dielectrics and shallow junctions
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1