{"title":"快速测试生成闪存阈值电压分布图","authors":"Raju Khubchandani","doi":"10.1109/MTDT.1999.782687","DOIUrl":null,"url":null,"abstract":"This paper describes a method to determine threshold voltage (V/sub th/) distribution as a multi-colored bitmap of the die. That is, a visual indication of relative threshold voltages on different areas of the die is provided. The spatial distribution of threshold voltage is felt to be more informative than conventional techniques which provide results as a bell-curve Gauss distribution plot of threshold voltage versus number of cells. The time required for test execution (including data gathering) is considerably less than the time taken by conventional methods.","PeriodicalId":166999,"journal":{"name":"Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A fast test to generate flash memory threshold voltage distribution map\",\"authors\":\"Raju Khubchandani\",\"doi\":\"10.1109/MTDT.1999.782687\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a method to determine threshold voltage (V/sub th/) distribution as a multi-colored bitmap of the die. That is, a visual indication of relative threshold voltages on different areas of the die is provided. The spatial distribution of threshold voltage is felt to be more informative than conventional techniques which provide results as a bell-curve Gauss distribution plot of threshold voltage versus number of cells. The time required for test execution (including data gathering) is considerably less than the time taken by conventional methods.\",\"PeriodicalId\":166999,\"journal\":{\"name\":\"Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-08-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MTDT.1999.782687\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTDT.1999.782687","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A fast test to generate flash memory threshold voltage distribution map
This paper describes a method to determine threshold voltage (V/sub th/) distribution as a multi-colored bitmap of the die. That is, a visual indication of relative threshold voltages on different areas of the die is provided. The spatial distribution of threshold voltage is felt to be more informative than conventional techniques which provide results as a bell-curve Gauss distribution plot of threshold voltage versus number of cells. The time required for test execution (including data gathering) is considerably less than the time taken by conventional methods.