高效内置自我修复的高水平合成技术

L. Guerra, M. Potkonjak, J. Rabaey
{"title":"高效内置自我修复的高水平合成技术","authors":"L. Guerra, M. Potkonjak, J. Rabaey","doi":"10.1109/DFTVS.1993.595623","DOIUrl":null,"url":null,"abstract":"Built-in-self-repair (BISR) is a hardware redundancy fault tolerance technique, where a set of spare modules is provided in addition to core operational modules. Until now, the application of BISR methodology has been limited to situations where a failed module of one type can only be replaced by a backup module of the same type. It is shown that in ASIC designs it is possible to enable replacement of modules of different types with the same spare units by exploiting the flexibility of high level synthesis solutions. Resource allocation, assignment and scheduling techniques that support a new BISR methodology are presented. All mentioned high level synthesis algorithms are developed on top of the HYPER high level synthesis system, using a novel statistical methodology for heuristic algorithm development and improvement. The effectiveness of the approach is verified and yield improvement data is presented for numerous real-life examples.","PeriodicalId":213798,"journal":{"name":"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","volume":"53 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"26","resultStr":"{\"title\":\"High level synthesis techniques for efficient built-in-self-repair\",\"authors\":\"L. Guerra, M. Potkonjak, J. Rabaey\",\"doi\":\"10.1109/DFTVS.1993.595623\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Built-in-self-repair (BISR) is a hardware redundancy fault tolerance technique, where a set of spare modules is provided in addition to core operational modules. Until now, the application of BISR methodology has been limited to situations where a failed module of one type can only be replaced by a backup module of the same type. It is shown that in ASIC designs it is possible to enable replacement of modules of different types with the same spare units by exploiting the flexibility of high level synthesis solutions. Resource allocation, assignment and scheduling techniques that support a new BISR methodology are presented. All mentioned high level synthesis algorithms are developed on top of the HYPER high level synthesis system, using a novel statistical methodology for heuristic algorithm development and improvement. The effectiveness of the approach is verified and yield improvement data is presented for numerous real-life examples.\",\"PeriodicalId\":213798,\"journal\":{\"name\":\"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems\",\"volume\":\"53 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-10-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"26\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1993.595623\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1993.595623","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 26

摘要

内置自修复(BISR)是一种硬件冗余容错技术,在核心操作模块之外提供一组备用模块。到目前为止,BISR方法的应用仅限于一种类型的故障模块只能由相同类型的备份模块替换的情况。研究表明,在ASIC设计中,利用高水平综合解决方案的灵活性,可以用相同的备用单元替换不同类型的模块。提出了支持新的BISR方法的资源分配、分配和调度技术。上述所有高级综合算法都是在HYPER高级综合系统的基础上开发的,使用一种新的统计方法进行启发式算法的开发和改进。通过实例验证了该方法的有效性,并给出了成品率提高的数据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
High level synthesis techniques for efficient built-in-self-repair
Built-in-self-repair (BISR) is a hardware redundancy fault tolerance technique, where a set of spare modules is provided in addition to core operational modules. Until now, the application of BISR methodology has been limited to situations where a failed module of one type can only be replaced by a backup module of the same type. It is shown that in ASIC designs it is possible to enable replacement of modules of different types with the same spare units by exploiting the flexibility of high level synthesis solutions. Resource allocation, assignment and scheduling techniques that support a new BISR methodology are presented. All mentioned high level synthesis algorithms are developed on top of the HYPER high level synthesis system, using a novel statistical methodology for heuristic algorithm development and improvement. The effectiveness of the approach is verified and yield improvement data is presented for numerous real-life examples.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
The T9 transputer: A practical example of the application of standard test techniques Fault detection in sequential circuits through functional testing A highly testable 1-out-of-3 CMOS checker System level policies for fault tolerance issues in the FERMI project Topological optimization of PLAs for yield enhancement
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1