E. Mizuta, Y. Nakada, S. Kuboyama, M. Inoue, Y. Kumagai, S. Tatemichi, T. Shiigi, T. Watashima, H. Shindou
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Radiation Test Results in Newly Developed Super-Junction Power MOSFETs
We report the results of single-event effects test using heavy ions and total ionizing dose test using γ-ray in JAXA qualified super-junction power MOSFETs manufactured by Fuji electric company and COTS super- junction power MOSFETs.