68hc16z1的可测试性特点

J. Lyon, Michael E. Gladden, E. Hartung, Eric Hoang, K. Raghunathan
{"title":"68hc16z1的可测试性特点","authors":"J. Lyon, Michael E. Gladden, E. Hartung, Eric Hoang, K. Raghunathan","doi":"10.1109/TEST.1991.519502","DOIUrl":null,"url":null,"abstract":"The purpose of this paper is to describe the testability features implemented in Motorola's recently completed design of a sixteen bit microcontroller, the 68HC16Z1. The discussion includes a brief introduction to the 68HC16Z1, test objectives and organization along with descriptions of design for test (DR) techniques and structures.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"TESTABILITY FEATURES OF THE 68HC16Z1\",\"authors\":\"J. Lyon, Michael E. Gladden, E. Hartung, Eric Hoang, K. Raghunathan\",\"doi\":\"10.1109/TEST.1991.519502\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The purpose of this paper is to describe the testability features implemented in Motorola's recently completed design of a sixteen bit microcontroller, the 68HC16Z1. The discussion includes a brief introduction to the 68HC16Z1, test objectives and organization along with descriptions of design for test (DR) techniques and structures.\",\"PeriodicalId\":272630,\"journal\":{\"name\":\"1991, Proceedings. International Test Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1991, Proceedings. International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1991.519502\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519502","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

本文的目的是描述摩托罗拉最近完成的16位微控制器68HC16Z1的可测试性特征。讨论包括对68HC16Z1的简要介绍,测试目标和组织以及测试设计(DR)技术和结构的描述。
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TESTABILITY FEATURES OF THE 68HC16Z1
The purpose of this paper is to describe the testability features implemented in Motorola's recently completed design of a sixteen bit microcontroller, the 68HC16Z1. The discussion includes a brief introduction to the 68HC16Z1, test objectives and organization along with descriptions of design for test (DR) techniques and structures.
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