{"title":"云计算在5nm及以上节点的现代逆向工程工作流中的作用","authors":"C. Pawlowicz, Bruno Trindade, Michael Green","doi":"10.31399/asm.cp.istfa2021p0163","DOIUrl":null,"url":null,"abstract":"\n A modern reverse engineering (RE) workflow contains many challenges, especially as process nodes drop below the 5nm node. With increased complexity, more circuitry is packed into a smaller area, requiring large quantities of raw data collected and subsequently processed to help reconstruct the original schematics. By leveraging inexpensive cloud computing, orders of magnitude improvement in throughput were achieved for 2D image registration and high quality image segmentation was achieved using machine learning.","PeriodicalId":188323,"journal":{"name":"ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"The Role of Cloud Computing in a Modern Reverse Engineering Workflow at the 5nm Node and Beyond\",\"authors\":\"C. Pawlowicz, Bruno Trindade, Michael Green\",\"doi\":\"10.31399/asm.cp.istfa2021p0163\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\n A modern reverse engineering (RE) workflow contains many challenges, especially as process nodes drop below the 5nm node. With increased complexity, more circuitry is packed into a smaller area, requiring large quantities of raw data collected and subsequently processed to help reconstruct the original schematics. By leveraging inexpensive cloud computing, orders of magnitude improvement in throughput were achieved for 2D image registration and high quality image segmentation was achieved using machine learning.\",\"PeriodicalId\":188323,\"journal\":{\"name\":\"ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.31399/asm.cp.istfa2021p0163\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.cp.istfa2021p0163","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The Role of Cloud Computing in a Modern Reverse Engineering Workflow at the 5nm Node and Beyond
A modern reverse engineering (RE) workflow contains many challenges, especially as process nodes drop below the 5nm node. With increased complexity, more circuitry is packed into a smaller area, requiring large quantities of raw data collected and subsequently processed to help reconstruct the original schematics. By leveraging inexpensive cloud computing, orders of magnitude improvement in throughput were achieved for 2D image registration and high quality image segmentation was achieved using machine learning.