{"title":"大型强子对撞机辐射环境下的前端电子学","authors":"A. Kerek","doi":"10.1109/DFTVS.1993.595709","DOIUrl":null,"url":null,"abstract":"Due to the high luminosity of LHC, the future accelerator of the European physics community, the number of events registered in a particle physics experiment is several order of magnitude higher than it is for the present generation detectors. This high countrate manifests also in the intense radiation in and around the experimental setup where the detector readout electronics is placed. This new radiation environment is compared to the radiation field in space where existing Rad Hard electronics is used. The radiation influence on electronics as well as different types of radiation hardened processes are discussed. A major expected contributor to the damage of semiconductors around LHC is the high flux of neutrons. The effect of this type of radiation, not present in space, is discussed.","PeriodicalId":213798,"journal":{"name":"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Front-end electronics in the radiation environment of LHC\",\"authors\":\"A. Kerek\",\"doi\":\"10.1109/DFTVS.1993.595709\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Due to the high luminosity of LHC, the future accelerator of the European physics community, the number of events registered in a particle physics experiment is several order of magnitude higher than it is for the present generation detectors. This high countrate manifests also in the intense radiation in and around the experimental setup where the detector readout electronics is placed. This new radiation environment is compared to the radiation field in space where existing Rad Hard electronics is used. The radiation influence on electronics as well as different types of radiation hardened processes are discussed. A major expected contributor to the damage of semiconductors around LHC is the high flux of neutrons. The effect of this type of radiation, not present in space, is discussed.\",\"PeriodicalId\":213798,\"journal\":{\"name\":\"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-10-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1993.595709\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1993.595709","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Front-end electronics in the radiation environment of LHC
Due to the high luminosity of LHC, the future accelerator of the European physics community, the number of events registered in a particle physics experiment is several order of magnitude higher than it is for the present generation detectors. This high countrate manifests also in the intense radiation in and around the experimental setup where the detector readout electronics is placed. This new radiation environment is compared to the radiation field in space where existing Rad Hard electronics is used. The radiation influence on electronics as well as different types of radiation hardened processes are discussed. A major expected contributor to the damage of semiconductors around LHC is the high flux of neutrons. The effect of this type of radiation, not present in space, is discussed.
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