{"title":"教程2:可变性及其对设计的影响","authors":"K. Bowman, M. Orshansky, S. Sapatnekar","doi":"10.1109/ISQED.2006.141","DOIUrl":null,"url":null,"abstract":"As digital designs scale down into the sub-100nm regime, the effects of variations are seen to dramatically affect the behavior of the circuit. These may arise from.","PeriodicalId":138839,"journal":{"name":"7th International Symposium on Quality Electronic Design (ISQED'06)","volume":"69 6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Tutorial II: Variability and Its Impact on Design\",\"authors\":\"K. Bowman, M. Orshansky, S. Sapatnekar\",\"doi\":\"10.1109/ISQED.2006.141\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As digital designs scale down into the sub-100nm regime, the effects of variations are seen to dramatically affect the behavior of the circuit. These may arise from.\",\"PeriodicalId\":138839,\"journal\":{\"name\":\"7th International Symposium on Quality Electronic Design (ISQED'06)\",\"volume\":\"69 6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-03-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"7th International Symposium on Quality Electronic Design (ISQED'06)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2006.141\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"7th International Symposium on Quality Electronic Design (ISQED'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2006.141","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
As digital designs scale down into the sub-100nm regime, the effects of variations are seen to dramatically affect the behavior of the circuit. These may arise from.