恩智浦P4080处理器在COSY加速器上的质子测试

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2018-09-01 DOI:10.1109/RADECS45761.2018.9328704

S. Hoeffgen, Mirko Liebender, M. Baum, Christopher Carl, O. Felden, Tobias Kündgen, W. Lennartz, S. Metzger, Samuel Plettner, Friedrich Schün

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摘要

恩智浦P4080处理器使用高达500 MeV的质子束进行SEE测试。测量了L2和L3缓存的单比特和多比特中断，以及具有不同签名的核心崩溃。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proton Testing of the NXP P4080 Processor at the COSY Accelerator

The NXP P4080 processor is tested for SEE using a proton beam of up to 500 MeV. Single and multiple bit upsets of the L2 and L3 cache were measured as well as core crashes with different signatures.

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2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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