A. Kalashnikova, V. Anashin, P. Chubunov, A. Koziukov, S. Iakovlev, R. Mangushev, A. Nilov
{"title":"放大器的重离子SEE测试结果","authors":"A. Kalashnikova, V. Anashin, P. Chubunov, A. Koziukov, S. Iakovlev, R. Mangushev, A. Nilov","doi":"10.1109/RADECS45761.2018.9328711","DOIUrl":null,"url":null,"abstract":"The paper presents heavy-ion test results for a sample of amplifiers. Linear Energy Transfer (LET) thresholds for Single Event Upset (SEU) and Latchup (SEL) effects, as well as for Destructive Failure (DF), have been obtained during experiments. Additionally, for some amplifiers voltage Safe Operating Area (SOA) has been determined.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Heavy-Ion SEE Test Results for Amplifiers\",\"authors\":\"A. Kalashnikova, V. Anashin, P. Chubunov, A. Koziukov, S. Iakovlev, R. Mangushev, A. Nilov\",\"doi\":\"10.1109/RADECS45761.2018.9328711\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents heavy-ion test results for a sample of amplifiers. Linear Energy Transfer (LET) thresholds for Single Event Upset (SEU) and Latchup (SEL) effects, as well as for Destructive Failure (DF), have been obtained during experiments. Additionally, for some amplifiers voltage Safe Operating Area (SOA) has been determined.\",\"PeriodicalId\":248855,\"journal\":{\"name\":\"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RADECS45761.2018.9328711\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS45761.2018.9328711","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The paper presents heavy-ion test results for a sample of amplifiers. Linear Energy Transfer (LET) thresholds for Single Event Upset (SEU) and Latchup (SEL) effects, as well as for Destructive Failure (DF), have been obtained during experiments. Additionally, for some amplifiers voltage Safe Operating Area (SOA) has been determined.