{"title":"用于低功耗应用的低压9T finfesram单元","authors":"F. Moradi, Mohammad Tohidi","doi":"10.1109/SOCC.2015.7406929","DOIUrl":null,"url":null,"abstract":"In this paper, a novel multi-threshold 9T-SRAM cell using FinFET technology with improved read and write margins in comparison with the standard 6T-SRAM cell is proposed. By the use of this bit-cell at supply voltage of 200mV (800mV), read and write margins are improved by 92% (97%) and 2X (40%), respectively. The proposed design operates at supply voltages lower than 300mV that results in a 3X lower power consumption compared to the standard 6T-SRAM cell.","PeriodicalId":329464,"journal":{"name":"2015 28th IEEE International System-on-Chip Conference (SOCC)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Low-voltage 9T FinFETSRAM cell for low-power applications\",\"authors\":\"F. Moradi, Mohammad Tohidi\",\"doi\":\"10.1109/SOCC.2015.7406929\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a novel multi-threshold 9T-SRAM cell using FinFET technology with improved read and write margins in comparison with the standard 6T-SRAM cell is proposed. By the use of this bit-cell at supply voltage of 200mV (800mV), read and write margins are improved by 92% (97%) and 2X (40%), respectively. The proposed design operates at supply voltages lower than 300mV that results in a 3X lower power consumption compared to the standard 6T-SRAM cell.\",\"PeriodicalId\":329464,\"journal\":{\"name\":\"2015 28th IEEE International System-on-Chip Conference (SOCC)\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 28th IEEE International System-on-Chip Conference (SOCC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SOCC.2015.7406929\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 28th IEEE International System-on-Chip Conference (SOCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SOCC.2015.7406929","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Low-voltage 9T FinFETSRAM cell for low-power applications
In this paper, a novel multi-threshold 9T-SRAM cell using FinFET technology with improved read and write margins in comparison with the standard 6T-SRAM cell is proposed. By the use of this bit-cell at supply voltage of 200mV (800mV), read and write margins are improved by 92% (97%) and 2X (40%), respectively. The proposed design operates at supply voltages lower than 300mV that results in a 3X lower power consumption compared to the standard 6T-SRAM cell.
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