{"title":"图像处理中缺陷阵列的可重构操作","authors":"J. Salinas, F. Lombardi","doi":"10.1109/DFTVS.1993.595657","DOIUrl":null,"url":null,"abstract":"The authors examine the operation and a reconfiguration strategy for two-dimensional SIMD parallel architectures in the presence of manufacturing cluster defects and/or link defects when used for image processing. The proposed technique is based on a conceptual reconfiguration of processing elements by covering each large defect area with a set of fault-free elements, thus creating a loss of image resolution instead of a loss of image data. The proposed technique has been emulated on a 2048 PE MasPar architecture assuming both mesh connected elements (four-way connection) and eight-way connections.","PeriodicalId":213798,"journal":{"name":"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","volume":"57 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"On the reconfigurable operation of arrays with defects for image processing\",\"authors\":\"J. Salinas, F. Lombardi\",\"doi\":\"10.1109/DFTVS.1993.595657\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors examine the operation and a reconfiguration strategy for two-dimensional SIMD parallel architectures in the presence of manufacturing cluster defects and/or link defects when used for image processing. The proposed technique is based on a conceptual reconfiguration of processing elements by covering each large defect area with a set of fault-free elements, thus creating a loss of image resolution instead of a loss of image data. The proposed technique has been emulated on a 2048 PE MasPar architecture assuming both mesh connected elements (four-way connection) and eight-way connections.\",\"PeriodicalId\":213798,\"journal\":{\"name\":\"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems\",\"volume\":\"57 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-10-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1993.595657\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1993.595657","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
摘要
作者研究了二维SIMD并行架构在用于图像处理时存在制造集群缺陷和/或链接缺陷的操作和重构策略。提出的技术是基于处理元素的概念重构,通过使用一组无故障元素覆盖每个大缺陷区域,从而造成图像分辨率的损失,而不是图像数据的损失。所提出的技术已经在2048 PE MasPar架构上进行了仿真,假设网格连接元素(四路连接)和八路连接。
On the reconfigurable operation of arrays with defects for image processing
The authors examine the operation and a reconfiguration strategy for two-dimensional SIMD parallel architectures in the presence of manufacturing cluster defects and/or link defects when used for image processing. The proposed technique is based on a conceptual reconfiguration of processing elements by covering each large defect area with a set of fault-free elements, thus creating a loss of image resolution instead of a loss of image data. The proposed technique has been emulated on a 2048 PE MasPar architecture assuming both mesh connected elements (four-way connection) and eight-way connections.