{"title":"PowerPC处理器和桥接芯片测试的最新结果","authors":"S. Guertin, F. Irom","doi":"10.1109/REDW.2010.5619489","DOIUrl":null,"url":null,"abstract":"Recent single event effect (SEE) test results for the Freescale 7447A and IBM 750FX microprocessors, and Marvell 64460 bridge chips are reported. The 7447A and 750FX results are compared to earlier work. The 64460 represents unique data. The data extraction methods for each test type are described. The 7447A and 750FX were found to have a single event upset (SEU) threshold of about 1 MeV-cm²/mg and saturated cross section of 2e-9 cm²/bit. Both devices have proton cross sections of about 1e-14cm²/bit and proton thresholds below 20 MeV. The 64460 was shown to have functional interrupts similar to single event latchup with threshold below 1 MeV-cm²/g and saturated cross section around 1 cm².","PeriodicalId":278033,"journal":{"name":"2010 IEEE Radiation Effects Data Workshop","volume":"78 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Recent Results for PowerPC Processor and Bridge Chip Testing\",\"authors\":\"S. Guertin, F. Irom\",\"doi\":\"10.1109/REDW.2010.5619489\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Recent single event effect (SEE) test results for the Freescale 7447A and IBM 750FX microprocessors, and Marvell 64460 bridge chips are reported. The 7447A and 750FX results are compared to earlier work. The 64460 represents unique data. The data extraction methods for each test type are described. The 7447A and 750FX were found to have a single event upset (SEU) threshold of about 1 MeV-cm²/mg and saturated cross section of 2e-9 cm²/bit. Both devices have proton cross sections of about 1e-14cm²/bit and proton thresholds below 20 MeV. The 64460 was shown to have functional interrupts similar to single event latchup with threshold below 1 MeV-cm²/g and saturated cross section around 1 cm².\",\"PeriodicalId\":278033,\"journal\":{\"name\":\"2010 IEEE Radiation Effects Data Workshop\",\"volume\":\"78 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-07-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE Radiation Effects Data Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW.2010.5619489\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE Radiation Effects Data Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.2010.5619489","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Recent Results for PowerPC Processor and Bridge Chip Testing
Recent single event effect (SEE) test results for the Freescale 7447A and IBM 750FX microprocessors, and Marvell 64460 bridge chips are reported. The 7447A and 750FX results are compared to earlier work. The 64460 represents unique data. The data extraction methods for each test type are described. The 7447A and 750FX were found to have a single event upset (SEU) threshold of about 1 MeV-cm²/mg and saturated cross section of 2e-9 cm²/bit. Both devices have proton cross sections of about 1e-14cm²/bit and proton thresholds below 20 MeV. The 64460 was shown to have functional interrupts similar to single event latchup with threshold below 1 MeV-cm²/g and saturated cross section around 1 cm².
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