伪工艺镀钯铜丝接头耐腐蚀机理研究

S. Nemoto, Takehiko Maeda, Masahiro Miyajima, Yasuhiko Akaike, K. Kitagawa, Hideki Ishii, H. Shimamoto, K. Kikuchi
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引用次数: 1

摘要

钯(Pd)对提高铜线的耐蚀性起着重要作用。为了检验铜丝的耐蚀性,对溅射[1]得到的Cu/Al界面进行了评价。特别地,通过制备伪钯包覆铜(PCC)样品和改变Pd浓度,研究了Pd对铜丝接头的影响。本文对伪PCC焊丝接头样品进行了耐蚀性评价,并与实际的Cu和PCC焊丝接头样品进行了对比。
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Investigation of mechanism of corrosion resistance of Pd coated Cu wire joint by pseudo process
Palladium (Pd) has played a big role to improve the corrosion resistance of copper (Cu) wire. To examine the corrosion resistance of Cu wire, the Cu/Al interface obtained by sputtering [1] was evaluated. In particular, the effect of Pd on Cu wire joints was investigated by preparing pseudo Palladium Coated Copper (PCC) samples and varying the Pd concentration. In this paper, pseudo PCC wire joint samples were evaluated for corrosion resistance and the results compared with those from actual Cu and PCC wire joint samples.
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