{"title":"用于亚阈值泄漏容限的fpga双vt设计","authors":"Akhilesh Kumar, M. Anis","doi":"10.1109/ISQED.2006.53","DOIUrl":null,"url":null,"abstract":"In this paper we propose a dual-Vt FPGA architecture for reduction of subthreshold leakage power. A CAD flow has been proposed based on the dual-Vt assignment algorithm and placement for realizing the dual-Vt FPGA architecture. Logic elements within the logic blocks are the candidates for dual-Vt assignment. We propose an architecture in which there are two kinds of logic blocks, one with all high-Vt logic elements and another with a fixed percentage of high-Vt logic elements. These two kinds of logic blocks are then placed in such a way that the FPGA architecture remains regular. Results indicate that in the ideal case of dual-Vt assignment, over 95% of the logic elements can be assigned high-Vt. Results show that leakage savings of 55% can be achieved. Design tradeoffs for various ratios of the two kinds of logic blocks are investigated. The dual-Vt FPGA CAD flow is intended for development and evaluation of dual-Vt FPGA architectures","PeriodicalId":138839,"journal":{"name":"7th International Symposium on Quality Electronic Design (ISQED'06)","volume":"115 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Dual-Vt design of FPGAs for subthreshold leakage tolerance\",\"authors\":\"Akhilesh Kumar, M. Anis\",\"doi\":\"10.1109/ISQED.2006.53\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we propose a dual-Vt FPGA architecture for reduction of subthreshold leakage power. A CAD flow has been proposed based on the dual-Vt assignment algorithm and placement for realizing the dual-Vt FPGA architecture. Logic elements within the logic blocks are the candidates for dual-Vt assignment. We propose an architecture in which there are two kinds of logic blocks, one with all high-Vt logic elements and another with a fixed percentage of high-Vt logic elements. These two kinds of logic blocks are then placed in such a way that the FPGA architecture remains regular. Results indicate that in the ideal case of dual-Vt assignment, over 95% of the logic elements can be assigned high-Vt. Results show that leakage savings of 55% can be achieved. Design tradeoffs for various ratios of the two kinds of logic blocks are investigated. The dual-Vt FPGA CAD flow is intended for development and evaluation of dual-Vt FPGA architectures\",\"PeriodicalId\":138839,\"journal\":{\"name\":\"7th International Symposium on Quality Electronic Design (ISQED'06)\",\"volume\":\"115 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-03-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"7th International Symposium on Quality Electronic Design (ISQED'06)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2006.53\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"7th International Symposium on Quality Electronic Design (ISQED'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2006.53","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Dual-Vt design of FPGAs for subthreshold leakage tolerance
In this paper we propose a dual-Vt FPGA architecture for reduction of subthreshold leakage power. A CAD flow has been proposed based on the dual-Vt assignment algorithm and placement for realizing the dual-Vt FPGA architecture. Logic elements within the logic blocks are the candidates for dual-Vt assignment. We propose an architecture in which there are two kinds of logic blocks, one with all high-Vt logic elements and another with a fixed percentage of high-Vt logic elements. These two kinds of logic blocks are then placed in such a way that the FPGA architecture remains regular. Results indicate that in the ideal case of dual-Vt assignment, over 95% of the logic elements can be assigned high-Vt. Results show that leakage savings of 55% can be achieved. Design tradeoffs for various ratios of the two kinds of logic blocks are investigated. The dual-Vt FPGA CAD flow is intended for development and evaluation of dual-Vt FPGA architectures