{"title":"超级栅极的晶体管级优化","authors":"D. Kagaris, T. Haniotakis","doi":"10.1109/ISQED.2006.139","DOIUrl":null,"url":null,"abstract":"The chip area and delay in digital VLSI design depends on the number of transistors that are used for the logic gates involved. While the determination of a series-parallel implementation can be straightforward once a simplified expression of the function is available, this may not be an optimum solution. In the current paper an improved approach for determining a satisfactory solution for complex gates is presented. Experimental results demonstrate the efficiency of the approach","PeriodicalId":138839,"journal":{"name":"7th International Symposium on Quality Electronic Design (ISQED'06)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Transistor-level optimization of supergates\",\"authors\":\"D. Kagaris, T. Haniotakis\",\"doi\":\"10.1109/ISQED.2006.139\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The chip area and delay in digital VLSI design depends on the number of transistors that are used for the logic gates involved. While the determination of a series-parallel implementation can be straightforward once a simplified expression of the function is available, this may not be an optimum solution. In the current paper an improved approach for determining a satisfactory solution for complex gates is presented. Experimental results demonstrate the efficiency of the approach\",\"PeriodicalId\":138839,\"journal\":{\"name\":\"7th International Symposium on Quality Electronic Design (ISQED'06)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-03-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"7th International Symposium on Quality Electronic Design (ISQED'06)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2006.139\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"7th International Symposium on Quality Electronic Design (ISQED'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2006.139","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The chip area and delay in digital VLSI design depends on the number of transistors that are used for the logic gates involved. While the determination of a series-parallel implementation can be straightforward once a simplified expression of the function is available, this may not be an optimum solution. In the current paper an improved approach for determining a satisfactory solution for complex gates is presented. Experimental results demonstrate the efficiency of the approach